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Posted inUCSB

New Model Shows How Electrons Cause Damage Inside Silicon Chips

Researchers in the UC Santa Barbara Materials Department have uncovered the elusive quantum mechanism by which energetic electrons break chemical bonds inside microelectronic devices — a detrimental process that slowly degrades performance over time. The discovery, published as an Editors’ Suggestion in Physical Review B, explains decades-old experimental puzzles and moves scientists closer to engineering […]

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